Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
An undulator beamline and small-angle-scattering spectrometer have been implemented at the Advanced Photon Source. The beamline is optimized for performing small-angle wide-bandpass coherent X-ray scattering measurements, and has been characterized by measuring static X-ray speckle patterns from isotropically disordered samples. Statistical analyses of the speckle patterns have been performed from which the speckle widths and contrast are extracted versus wavevector transfer and sample thickness. The measured speckle widths and contrast are compared with an approximation to the intensity correlation function and found to be in good agreement with its predictions.

Subscribe to Journal of Synchrotron Radiation

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds