issue contents

JOURNAL OF
SYNCHROTRON
RADIATION

Volume 4| Part 3

ISSN: 1600-5775

May 1997 issue

Cover illustration: Aerial view of the Advanced Photon Source at the Argonne National Laboratory, venue for the Synchrotron Radiation Satellite Meeting of the XVII IUCr Congress, 4-7 August 1996.

facility information

APS

MAX IV

PSI

SPring‑8

research papers

Brilliance – an Overview

M. Eriksson

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Status of MAX II

M. Eriksson

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X-ray Optics Developments at the APS for the Third Generation of High-Energy Synchrotron Radiation Sources

D. M. Mills

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Asymmetric Fraunhofer Diffraction from Roller-Blade Slits

J. L. Libbert, J. A. Pitney and I. K. Robinson

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A System for Integrated Collection and Analysis of Crystallographic Diffraction Data

D. M. E. Szebenyi, A. Arvai, S. Ealick, J. M. LaIuppa and C. Nielsen

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Large-Format Imaging Plate and Weissenberg Camera for Accurate Protein Crystallographic Data Collection Using Synchrotron Radiation

K. Sakabe, K. Sasaki, N. Watanabe, M. Suzuki, Z. G. Wang, J. Miyahara and N. Sakabe

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Applications of High-Energy Synchrotron Radiation for Structural Studies of Polycrystalline Materials

H. F. Poulsen, S. Garbe, T. Lorentzen, D. Juul Jensen, F. W. Poulsen, N. H. Andersen, T. Frello, R. Feidenhans'l and H. Graafsma

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Compression Behaviour of Elastically Anisotropic Polycrystals Using Energy-Dispersive X-ray Diffraction

J. W. Otto, J. K. Vassiliou and G. Frommeyer

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Synchrotron Radiation Study of the Relation between Structure and Strain in Polyurethane Elastomers

D. C. Creagh, P. M. O'Neill and D. J. Martin

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Application of Imaging-Grazing-Incidence X-ray Diffraction and Specular Reflectivity to the Structural Investigation of Quantum-Confinement Semiconductor Devices

S. A. Holt, A. S. Brown, D. C. Creagh and R. Leon

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X-ray Reflectivity at the L Edges of Gd

N. Ishimatsu, C. T. Venkataraman, H. Hashizume, N. Hosoito, K. Namikawa and T. Iwazumi

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On the Off-Bragg Reflectivity Enhancement in Dynamical Multiple Diffraction of X-rays by an In_0.5Ga_0.5P/GaAs Heteroepitaxial Structure

M. V. Kovalchuk, A. Ya. Kreines, L. V. Samoilova and A. M. Mel'nikov

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X-ray Reflectivity Study of Semiconductor Interfaces

M. K. Sanyal, A. Datta, S. Banerjee, A. K. Srivastava, B. M. Arora, S. Kanakaraju and S. Mohan

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notes and news

Notes and News

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