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Figure 1
Backscattered electron micrograph of the regions investigated by PEEM on polished composite minerals containing chalcopyrite, pyrrhotite and pentlandite (Fr = sample analysed by freshly polished PEEM; Ox = sample analysed by PEEM after oxidation).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 5| July 2010| Pages 606-615
doi:10.1107/S0909049510026749
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