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Figure 1
X-ray photoelectron spectroscopy spectrum of the SiO2/Si sample surface at a photon energy of 1860 eV. The inset shows an enlarged view of Si KLL.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 2| March 2017| Pages 445-448
https://doi.org/10.1107/S1600577516019676
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