A high-energy-resolution resonant inelastic X-ray scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

Moretti Sala, M.; Martel, K.; Henriquet, C.; Al Zein, A.; Simonelli, L.; Sahle, C.; Gonzalez, H.; Lagier, M.-C.; Ponchut, C.; Huotari, S.; Verbeni, R.; Krisch, M.; Monaco, G.

doi:10.1107/S1600577518001200

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Figure 5
Measured elastic lines at 11.215 keV employing five R = 2 m Si(844) diced crystal analysers and a Si(844) backscattering channel-cut. The width of the curves is 25 ± 3 meV. In the inset we track the displacement of the foci on the detector as a function of the incident photon energy. The slope of 4.7 µm meV⁻¹ is related to the pixel size contribution to the energy resolution, p/4.7 = 11.7 meV pixel⁻¹, in agreement with the estimate of $[\Delta\omega_{\rm{p}}]$ given in the text.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 2| March 2018| Pages 580-591

https://doi.org/10.1107/S1600577518001200

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