A high-energy-resolution resonant inelastic X-ray scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

Moretti Sala, M.; Martel, K.; Henriquet, C.; Al Zein, A.; Simonelli, L.; Sahle, C.; Gonzalez, H.; Lagier, M.-C.; Ponchut, C.; Huotari, S.; Verbeni, R.; Krisch, M.; Monaco, G.

doi:10.1107/S1600577518001200

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 7
RIXS spectrometer equipped with the R = 2 m crystal analysers chamber in various scattering geometries for $[\gamma_0]$ = 90° and $[\delta_0]$ = 0 (a), $[\gamma_0]$ = 0 and $[\delta_0]$ = 0 (b) and (c), $[\gamma_0 = 0]$ and $[\delta_0]$ = 90° (d). In (b) the RIXS chamber is in the position for scattering in the horizontal plane, while in (c) it is rotated around the source-to-middle crystal analyser axis by 90° for scattering in the vertical plane. All combinations of these geometries are also possible.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 2| March 2018| Pages 580-591

https://doi.org/10.1107/S1600577518001200

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page