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Figure 11
Evolution over time of the position of the Se K-edge in the case of a GeSe compound using a Si(111) crystal. The original data are EXAFS spectra extending over 800 eV above the edge and repeated over a few days. The precise position of the edge has been determined by shifting (angle from the Bragg encoder counts) one spectrum over the reference at t = 0 and minimizing the sum of squares of the point-to-point difference in the XANES region. Experimental data with the error bars are represented by points. The line is a guide for the eye.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 2| March 2019| Pages 551-558
https://doi.org/10.1107/S160057751801843X
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