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Figure 4
(a) Out-of-plane XRD of the used LSMO film (red) and an STNO substrate (black) demonstrating epitaxial growth. (b) AFM image of the film demonstrating a very low roughness of the order of a unit-cell step.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 4| July 2019| Pages 1266-1271
https://doi.org/10.1107/S1600577519003898
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