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Figure 1
Experimental setup of the single-beam optical-trap sample holder and the X-ray diffractometer (top view). For clarity, the top-view microscope (installed above the sample cell and parallel to the z axis) is not shown.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 1| January 2020| Pages 67-74
https://doi.org/10.1107/S1600577519013651
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