X-ray diffraction measurement of a single nanometre-sized particle levitated in air by an optical-trap sample holder

Fukuyama, Y.; Yasuda, N.; Sugimoto, K.; Kimura, S.

doi:10.1107/S1600577519013651

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 7
X-ray diffraction profile of (a) the single ZnO particle and (b) the assemblage of ZnO particles. The insets in (a) and (b) emphasize the intensities around the (206) reflection.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 1| January 2020| Pages 67-74

https://doi.org/10.1107/S1600577519013651

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