view article
Figure 4
Full-field CDI. Speckle resolution as a function of simulated rays. Three test cases are shown for a 4 mm-sized detector with 400 pixels set at a 5 m distance from the sample. All plots are on a logarithmic scale, with the same color bar. The profile is plotted along the X direction and is averaged on a length of seven pixels along the Y direction. Averaging helps to distinguish between speckles and fluctuations on a smaller scale due to noise. The speckles at higher spatial frequency are better resolved for increasing numbers of simulated rays N, whereas they are buried into background noise with fewer rays.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 1| January 2020| Pages 134-145
https://doi.org/10.1107/S1600577519014425
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS