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Figure 4
(a) SEM image and (b) Zn K-edge XAS for the single ZnO microrod. (c) The corresponding TR-XEOL streak images with X-ray energies set across the Zn K-edge and (d) the lifetimes obtained by fitting the TR-XEOL traces of (c).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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