Electronic structure variations of polar and nonpolar ZnO lattices with nitro­gen-ion bombardment using synchrotron-based in situ photoemission and X-ray absorption spectroscopy

Huang, Y.; Li, Y.; Wu, M.; Wang, H.-Q.; Yuan, X.; Gholam, T.; Zeng, H.; Wang, J.-O.; Wu, R.; Qian, H.-J.; Zhang, Y.; Kang, J.

doi:10.1107/S160057751901381X

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Figure 6
Angular-dependent O K-edge XAS spectra of (a) N-doped m-plane (solid lines) ZnO and the pristine m-ZnO (dotted lines) and (b) N-doped o-plane ZnO (solid lines) and the pristine o-ZnO (dotted lines) with incident angles θ = 90°, 40° and 30°.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 1| January 2020| Pages 83-89

https://doi.org/10.1107/S160057751901381X

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