Examining a synchrotron-based approach for in situ analyses of Al speciation in plant roots

Li, Z.; Wang, P.; Menzies, N.W.; McKenna, B.A.; Karunakaran, C.; Dynes, J.J.; Arthur, Z.; Liu, N.; Zuin, L.; Wang, D.; Kopittke, P.M.

doi:10.1107/S1600577519014395

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Figure 1
The effect of Al concentration on the RRER of soybean (a), buckwheat (b) and Arabidopsis (c). For soybean and buckwheat, data are the arithmetic means of three replicates (each with seven seedlings). For Arabidopsis, data are the arithmetic means of more than 30 individual seedlings in one Petri dish. Standard deviations are shown.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 1| January 2020| Pages 100-109

https://doi.org/10.1107/S1600577519014395

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