Examining a synchrotron-based approach for in situ analyses of Al speciation in plant roots

Li, Z.; Wang, P.; Menzies, N.W.; McKenna, B.A.; Karunakaran, C.; Dynes, J.J.; Arthur, Z.; Liu, N.; Zuin, L.; Wang, D.; Kopittke, P.M.

doi:10.1107/S1600577519014395

Journal of Synchrotron Radiation Journal of
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Figure 3
In situ Al K-edge XANES spectra for nine Al standard compounds obtained using synchrotron-based XAS. 50Sat is 50% saturation, 100Sat is 100% saturation and 150Sat is 150% saturation. PFY = partial fluorescence yield.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 1| January 2020| Pages 100-109

https://doi.org/10.1107/S1600577519014395

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