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Figure 2
Experimental layout of X-ray microscopy with two sets of IS-50M and O-30-H refractive lenses (a). Images of the test structure in the near-field, obtained using beryllium CRLs grades O-30-H (b) and IS-50M (c). Intensity distribution profiles measured along the line marked on the images of the test structure obtained using CRLs of grades O-30-H (c) and IS-50M (d).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 1| January 2020| Pages 44-50
https://doi.org/10.1107/S1600577519015625
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