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Figure 10
Illustration of XPS capabilities of PEAXIS on a 100 nm-thick Au film. A survey scan (a) and a fine scan at the Au 4f lines (b) recorded for 1000 eV incident photon energy and standard beamline mode.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 1| January 2020| Pages 238-249
https://doi.org/10.1107/S1600577519014887
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