Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4–250 eV

Svechnikov, M.; Chkhalo, N.; Lopatin, A.; Pleshkov, R.; Polkovnikov, V.; Salashchenko, N.; Schäfers, F.; Sertsu, M.G.; Sokolov, A.; Tsybin, N.

doi:10.1107/S1600577519014188

Journal of Synchrotron Radiation Journal of
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Figure 1
Schematic structure of samples on substrates and free-standing films. The Mg layer thickness shown here is nominal, and the thicknesses of Be and BeO are determined according to the reflectometry of the samples on the substrates and transmission measurements of free-standing films.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 1| January 2020| Pages 75-82

https://doi.org/10.1107/S1600577519014188

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