Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4–250 eV

Svechnikov, M.; Chkhalo, N.; Lopatin, A.; Pleshkov, R.; Polkovnikov, V.; Salashchenko, N.; Schäfers, F.; Sertsu, M.G.; Sokolov, A.; Tsybin, N.

doi:10.1107/S1600577519014188

Journal of Synchrotron Radiation Journal of
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Figure 2
Angular and spectral reflection curves from films on substrates. In (a) and (b) the wavelength is fixed; in (c) and (d) the grazing angle of the probe beam is fixed.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 1| January 2020| Pages 75-82

https://doi.org/10.1107/S1600577519014188

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