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Figure 1
XFEL pulse characterization using single-particle diffraction. Schematics of the single-particle diffraction experiments using focused single XFEL pulses employing the fixed target sample loading scheme are shown. Au nanospheres of diameter 100 nm are randomly located with respect to the focused XFEL beam with the intensity reflecting on the X-ray beam profile. Each single nanoparticle receives different photon flux depending on its location within the X-ray footprint.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 1| January 2020| Pages 17-24
https://doi.org/10.1107/S1600577519015443
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