Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction

Lee, H.; Shin, J.; Cho, D.H.; Jung, C.; Sung, D.; Ahn, K.; Nam, D.; Kim, S.; Kim, K.S.; Park, S.-Y.; Fan, J.; Jiang, H.; Kang, H.C.; Tono, K.; Yabashi, M.; Ishikawa, T.; Noh, D.Y.; Song, C.

doi:10.1107/S1600577519015443

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Figure 4
Deviation in the fringe oscillation due to spectral broadening. Radial intensity is calculated for the 100 nm Au nanosphere, and the results are compared for different spectral bandwidths of $[\Delta{E}/E]$ = 10⁻² in (a) and $[\Delta{E}/E]$ = 10⁻³ in (b) relative to $[\Delta{E}/E]$ = 0 (black solid line with square). The shift in the fringe oscillation period due to the spectral broadening becomes discernible after the mth pixel with m ≃ $[E/\Delta{E}]$ .

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 27| Part 1| January 2020| Pages 17-24

https://doi.org/10.1107/S1600577519015443

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