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Figure 3
Measured 2D profiles of the THz and XUV beams. (a) THz beam profile at 100 µm with an FWHM of 400 ± 20 µm × 1470 ± 30 µm. (b) XUV beam at 13.5 nm wavelength through a 3 mm pinhole placed ∼30 m upstream of the experiment with an FWHM of 230 ± 30 µm. (c) THz beam profile at 8 µm wavelength with an FWHM of 180 ± 15 µm × 320 ± 15 µm. (d) XUV beam at 13.5 nm wavelength with a 10 mm pinhole at the same position as in (b) with an FWHM of 140 ± 20 µm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 1| January 2020| Pages 11-16
https://doi.org/10.1107/S1600577519014164
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