Figure 6
Incident beam post-slit: without DAC (I0 slit) and with DAC (I0 DAC). Rescaled (I0 slit, I0 DAC) are compared in the inset. I0 DAC demonstrates the significant presence of glitches. (b) Incident (I0 DAC), absorption (It DAC) and (rescaled) normalized absorption spectra (I0 DAC/It DAC) for Nb foil in the presence of DACs. (c) Comparison of normalized absorption spectra for Nb foil, in the absence and presence of the DAC. |