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Figure 9
(a) XAS spectrum of the SnO film at the homogeneous portion, or at point #3 in Figs. 10[link](c) and 10[link](d). (b, c) Enlarged views near the Sn M-edge and O K-edge, respectively. The spectrum is measured using the total electron yield method at room temperature.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 4| July 2020| Pages 923-933
https://doi.org/10.1107/S1600577520006712
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