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Figure 6
(a) SEM image of an irregular core/shell InGaN/GaN MQWs wire characterized simultaneously by XRF and XEOL at 6 K. (b) Superimposed XRF intensity maps of Ga (blue) and In (green) Kα-lines. (c) Superimposed XEOL intensity maps for three energy ranges: 2.4–2.5 eV (red); 2.9–3.1 eV (green); 3.4–3.5 eV (blue). (d) Average XRF spectrum of the wire. (e) XEOL spectra acquired in an area of 140 nm × 140 nm (2 × 2 pixels) in three different positions as indicated by the symbols (triangle, square and circle) in the images. The asterisk shows the common GaN yellow defect band. The coloured energy ranges illustrate those plotted in the superimposed maps. Scale bars correspond to 1 µm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 4| July 2020| Pages 1074-1079
https://doi.org/10.1107/S1600577520007110
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