Sample chamber for synchrotron based in-situ X-ray diffraction experiments under electric fields and temperatures between 100 K and 1250 K

Nentwich, M.; Weigel, T.; Richter, C.; Stöcker, H.; Mehner, E.; Jachalke, S.; Novikov, D.V.; Zschornak, M.; Meyer, D.C.

doi:10.1107/S1600577520014344

Journal of Synchrotron Radiation Journal of
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Figure 13
Relative permittivity ɛ_r (left) and dielectric loss tan(δ) (right) of a sapphire plate measured with the presented chamber (blue) and with an established laboratory setup (red; difference of both in green).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 1| January 2021| Pages 158-168

https://doi.org/10.1107/S1600577520014344

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