Sample chamber for synchrotron based in-situ X-ray diffraction experiments under electric fields and temperatures between 100 K and 1250 K

Nentwich, M.; Weigel, T.; Richter, C.; Stöcker, H.; Mehner, E.; Jachalke, S.; Novikov, D.V.; Zschornak, M.; Meyer, D.C.

doi:10.1107/S1600577520014344

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Figure 8
Powder XRD measurements with Cu Kα radiation of a Si standard sample (NIST SRM 640d) with different domes and without dome (air). The domes were evacuated to a rough vacuum of 280 mbar. (a) Complete measured pattern. (b) Reflection 111 in detail. (c) Signal-to-noise ratio.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 1| January 2021| Pages 158-168

https://doi.org/10.1107/S1600577520014344

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