Journal of Synchrotron Radiation
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Figure 9
RSD measurement of the thin film sample, exemplarily for the 025 reflection at four different temperatures.
JOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28
|
Part 1
|
January 2021
|
Pages 158-168
https://doi.org/10.1107/S1600577520014344
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access
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