view article
Figure 5
Line profiles of (a) TEEM (1000°C) and (b) UV-PEEM (RT) image intensities of used CeB6 after 1500°C annealing along the 0° and 45° directions.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 6| November 2021| Pages 1729-1736
https://doi.org/10.1107/S1600577521009656
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS