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![[Figure 1]](fv5144fig1mag.jpg)
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Figure 1
Schematic of the setup. The X-rays enter from the left and are focused by a partially covered Fresnel zone plate (FZP). An order sorting aperture (OSA) is positioned in the back focal plane of the FZP in order to minimize the impact of higher diffraction orders from the FZP. The grating with period p is placed in the divergent beam such that a magnified self-image with fringe period pf occurs in the detection plane. The sample can be either placed downstream of the focus, corresponding to a projection microscope and suggested by the solid circle, or in a conjugate plane upstream of the FZP as implied by the dashed circle, resulting in an imaging microscope. Specific distances of the setup, as they are introduced in the main text, are indicated. |
![[Figure 1]](fv5144fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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