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Figure 4
Overview of the data evaluation for grating interferometry. (a) Dark frame corrected raw data for a sample measurement in analog digital units (adu) of the sCMOS camera. The inset highlights the interference pattern over a region of 100 × 100 pixels. (b) Complex wavefield reconstructed from this single-exposure data via the SIR method. The amplitude is mapped to brightness and the phase to hue, as indicated by the adjacent colour wheel. (c) Wavefield after backpropagation to the sample plane. (d) Phase shift of the sample after reference correction. The scale bar indicates 1 mm length in panels (a) and (b) and 10 µm in (c) and (d).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 29| Part 3| May 2022| Pages 794-806
https://doi.org/10.1107/S160057752200193X
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