Single-exposure X-ray phase imaging microscopy with a grating interferometer

Wolf, A.; Akstaller, B.; Cipiccia, S.; Flenner, S.; Hagemann, J.; Ludwig, V.; Meyer, P.; Schropp, A.; Schuster, M.; Seifert, M.; Weule, M.; Michel, T.; Anton, G.; Funk, S.

doi:10.1107/S160057752200193X

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Figure 5
Overview of the data evaluation for PBPCI. (a) Dark frame corrected raw data for a sample measurement in analog digital units (adu) of the sCMOS camera. (b) Normalized intensity, obtained by the empty beam division. (c) Phase reconstruction obtained with the RAAR scheme from (b). The scale bar indicates 1 mm length in the detection plane for panels (a) and (b) and 10 µm in the sample plane for (c).

JOURNAL OF
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ISSN: 1600-5775

Volume 29| Part 3| May 2022| Pages 794-806

https://doi.org/10.1107/S160057752200193X

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