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Figure 4
(a) Illustration of the reflectivity geometry and the layer parameters in the model. ho,t,i,w and δo,t,i,w are layer thicknesses and dispersions; σo,t,i,w,Si are interface roughnesses; and I0 is the incident flux (i.e. an intensity scale factor of the reflectivity). (b) Traces of parameters from HMCMC. (c) ACFs of parameters after 100-iteration burn-in. (d) Probability distributions of parameters. The off-diagonal panels are joint distributions, and the histograms along the diagonal are marginal distributions. (e) Reflectivity R and its 95% confidence from post-burn-in HMCMC samplings. For clarify, the reflectivity is scaled by a factor q4, where q = [(4\pi/\lambda)\sin\theta_{\rm{i}}], λ is the X-ray wavelength, and θi is the incident angle for the reflectivity scan. (f) 95% confidence of the dispersion profile. The solid blue line is the median (50%) profile. The red solid line is the step-like profile without roughness smearing. The blue dashed lines are profiles of each layer with smearing.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 29| Part 3| May 2022| Pages 721-731
https://doi.org/10.1107/S1600577522003034
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