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![[Figure 5]](ju5043fig5mag.jpg)
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Figure 5
(a) Schematics of the thin-film waveguide and principle of the X-ray waveguide fluorescence holography. The meanings of involved parameters to be optimized for are described in the text. (b) Fluorescence hologram on an area detector mounted in the plane of the film surface at a right angle with respect to the incident plane. The hologram is integrated in the horizontal plane to obtain the one-dimensional intensity profile as a function of the exit angle αf. Panels (c) and (d) are, respectively, the calculated XWFH and corresponding Au atomic number density profiles at different HMCMC iterations. (e) Traces of PtBA layer thickness dptba, capping PS layer thickness dps, total film thickness dps+ptba, and the residual variance. (f) p-values of the 30 CBS coefficients calculated from the last 1400 iterations. The dashed red line corresponds to a p-value of 0.05, i.e. a significance level of 95%. (g) 95% confidence interval of the total XWFH, and median (50% percentile) contributions from the Au Lα1,2, Au Lβ2,15, and elastic scattering background. (h) 95% confidence of the Au atomic number density distribution profile. The solid line is the median. |
![[Figure 5]](ju5043fig5.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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