An X-ray beam profile monitoring system at a beamline front-end combining a single-crystal diamond film and energy discrimination using droplet analysis

Kudo, T.; Sano, M.; Matsumoto, T.; Itoga, T.; Goto, S.; Takahashi, S.

doi:10.1107/S1600577522002466

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
Beam images for a fundamental energy of 12.4 keV captured using a single-crystal diamond film (left) and a polycrystalline diamond film (right).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 3| May 2022| Pages 670-676

https://doi.org/10.1107/S1600577522002466

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