High-resolution electron time-of-flight spectrometers for angle-resolved measurements at the SQS Instrument at the European XFEL

De Fanis, A.; Ilchen, M.; Achner, A.; Baumann, T.M.; Boll, R.; Buck, J.; Danilevsky, C.; Esenov, S.; Erk, B.; Grychtol, P.; Hartmann, G.; Liu, J.; Mazza, T.; Montaño, J.; Music, V.; Ovcharenko, Y.; Rennhack, N.; Rivas, D.; Rolles, D.; Schmidt, P.; Sotoudi Namin, H.; Scholz, F.; Viefhaus, J.; Walter, P.; Ziółkowski, P.; Zhang, H.; Meyer, M.

doi:10.1107/S1600577522002284

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Figure 3
Simulated and measured electron energy widths for different electron energies and different retardation V_ret. Isolated squares and linked circles are for measurements and simulations, respectively.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 3| May 2022| Pages 755-764

https://doi.org/10.1107/S1600577522002284

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