Use of diamond sensors for a high-flux, high-rate X-ray pass-through diagnostic

Bohon, J.; Gonzalez, E.; Grace, C.; Harris, C.T.; Jacobsen, B.; Kachiguine, S.; Kim, D.; MacArthur, J.; Martinez-McKinney, F.; Mazza, S.; Nizam, M.; Norvell, N.; Padilla, R.; Potter, E.; Prakash, T.; Prebys, E.; Ryan, E.; Schumm, B.A.; Smedley, J.; Stuart, D.; Tarka, M.; Torrecilla, I.S.; Wilder, M.; Zhu, D.

doi:10.1107/S1600577522003022

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Figure 3
Detail of the readout PCB signal path of the SCIPP assembly, showing the 37 µm-thick diamond sensor, the low-impedance indium band connecting the sensor to the readout network, the series array of 1 Ω and 10 mΩ resistors that shunt the signal to ground, and the two 50 Ω pick-off traces.

JOURNAL OF
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RADIATION

ISSN: 1600-5775

Volume 29| Part 3| May 2022| Pages 595-601

https://doi.org/10.1107/S1600577522003022

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