Design and performance of a dedicated coherent X-ray scanning diffraction instrument at beamline NanoMAX of MAX IV

Carbone, D.; Kalbfleisch, S.; Johansson, U.; Björling, A.; Kahnt, M.; Sala, S.; Stankevic, T.; Rodriguez-Fernandez, A.; Bring, B.; Matej, Z.; Bell, P.; Erb, D.; Hardion, V.; Weninger, C.; Al-Sallami, H.; Lidon-Simon, J.; Carlson, S.; Jerrebo, A.; Norsk Jensen, B.; Bjermo, A.; Åhnberg, K.; Roslund, L.

doi:10.1107/S1600577522001333

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Figure 10
(Left) A piezo rotation stage mounted on top of the piezo scanner breadboard with a pin holding the sample for a nano-tomography experiment. (Center) Estimated position error in the radial and (right) axial directions. Both measurements show the resulting sum of all contributions: that is, the position errors from every stage in the stacks, as well as long-term drifts in the whole setup.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 3| May 2022| Pages 876-887

https://doi.org/10.1107/S1600577522001333

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