Design and performance of a dedicated coherent X-ray scanning diffraction instrument at beamline NanoMAX of MAX IV

Carbone, D.; Kalbfleisch, S.; Johansson, U.; Björling, A.; Kahnt, M.; Sala, S.; Stankevic, T.; Rodriguez-Fernandez, A.; Bring, B.; Matej, Z.; Bell, P.; Erb, D.; Hardion, V.; Weninger, C.; Al-Sallami, H.; Lidon-Simon, J.; Carlson, S.; Jerrebo, A.; Norsk Jensen, B.; Bjermo, A.; Åhnberg, K.; Roslund, L.

doi:10.1107/S1600577522001333

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Figure 11
A close-up photograph of the sample stage: the top microscope (TM), the on-axis microscope (OAM), the 45° mirror with the central hole indicated by the white arrow, the ion chamber (IC) and the fluorescence detector (FD) are marked. The comb-like sample support is designed for X-ray fluorescence and/or transmission measurements. The breadboard fixed on the sample scanner provides flexibility for sample mounting.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 3| May 2022| Pages 876-887

https://doi.org/10.1107/S1600577522001333

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