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Figure 5
Beam profiles at (a) 10 keV and (b) 18 keV. The profiles in focus are determined by ptychographic imaging 300 µm out of focus and subsequent numerical wavefront propagation. The in-focus images (left) show intensity on a log scale, while the propagation images (right) show side views of the beam intensity on a linear scale. (c) The movement of the focal planes of the two mirrors along the beam propagation, measured with respect to their initial positions, during a 13.5 h experiment at 10 keV. At this energy, the depth of focus of the X-ray beam is 330 µm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 29| Part 3| May 2022| Pages 876-887
https://doi.org/10.1107/S1600577522001333
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