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Figure 6
Calculated total reflectivity for a reflection on an SiO2 surface for multiple reflections of X-rays with an energy of 17.4 keV.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 29| Part 6| November 2022| Pages 1376-1384
https://doi.org/10.1107/S1600577522009699
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