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Figure 3
Diffraction patterns from single objects in a random orientation: (a) 5o6a [for TBEV in Fig. 1[link](a)]; (b) 5o6v [for TBEV with Fab-fragments in Fig. 1[link](b)]. Simulation parameters: 2.07 Å wavelength, 300 nm X-ray beam focus, 512 × 512 pixel detector size, 400 µm × 400 µm pixel size, 2.5 m sample-to-detector distance and 1012 photons signal intensity at the focus.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 1| January 2023| Pages 24-34
https://doi.org/10.1107/S1600577522011341
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