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Figure 5
Diffraction patterns from a single TBEV in a random orientation. At sample-to-detector distances of (a, d, g) 1 m; (b, e, h) 2 m; and (c, f, i) 3 m. (d)–(f) Examples of diffraction patterns with the detector mask superimposed on them. (g)–(i) Angular averaged intensities of the diffraction patterns shown in (a)–(c). Detector parameters are the same as in Fig. 3[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 1| January 2023| Pages 24-34
https://doi.org/10.1107/S1600577522011341
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