view article
Figure 16
The spread of pixel intensities for the (a) 10 µm foil and (b) 50 µm foil across the whole above-edge energy range. Fluorescence intensities in each of the 100 detector elements, normalized by the upstream ion chamber counts at the absorption edge (9.671 keV), normalized to pixel #55 (close to the centre), across a broad range of energies. For the 10 µm foil, the spread is due to the low count rate and noise, i.e. the experimental uncertainty. For the 50 µm foil, there is a very clear divergence between pixels, caused by self-absorption. The intensity decreases as we move across the detector, as predicted by self-absorption (Fig. 14[link]). SeAFFlux provides geometrical, self-absorption and mode (fluorescence, attenuation) corrections to convert fluorescence intensity into a quantitative [[{{\mu}/{\rho}}]^{*}_{\rm{pe}}], ready for analysis using traditional XAFS packages. SeAFFluX uses the experimental geometry to model the divergence and correct accordingly for each pixel, rather than just averaging the pixels.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 1| January 2023| Pages 147-168
https://doi.org/10.1107/S1600577522010293
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS