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Figure 2
Transmission ratio of the downstream (I1) ion chamber normalized by the upstream (I0) ion chamber for (a, b) the 10 µm foil and (c) the 50 µm foil. The 10 µm data show highly detailed XAFS well beyond the edge, and temperature variation. The σ reported in (a) and (c) is the standard error of three repeated measurements, <0.1% for the 10 µm foil. All XAFS is lost in the 50 µm data, where I1/I0 ≃ exp(−10).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 1| January 2023| Pages 147-168
https://doi.org/10.1107/S1600577522010293
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