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Figure 2
Experimental setup. (a) Mirror surface profiling with a Fizeau interferometer (λ = 658 nm) mounted vertically above the bimorph mirror. (b) An example interferogram. Four such measurements are acquired simultaneously and used to recover a surface profile, which is cropped to the active area of the mirror.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 1| January 2023| Pages 57-64
https://doi.org/10.1107/S1600577522011080
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