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Figure 2
Representations of the components of the MAD system using a single-crystal-comb block and a Soller-collimator block which are optimized to filter X-ray beams in the 22–46 keV energy range: the energy of the X-rays determines the width of the impact of the filtered beams on the Si(111) crystals, the length of the Si(111) blades defines the width e of the filtered beams. Representation of the paths of the beams filtered by this MAD system having a pitch of 0.1°: the single-crystal-comb is at D = 973 mm from the sample and the period between each analyser crystal is 1.7 mm (crystal thickness 0.5 mm + space 1.20 mm), the Soller-collimator block is at Ds = 1033–1093 mm from the sample and the distance between the absorbing blades is 1.82 to 1.88 mm (see Part 1BB64). (a) Photographs of the small single-crystal-comb and the Soller-collimator blocks; the comb is mounted on the goniometer ΘA axis and the Soller-collimator block is mounted on the 2ΘA arm of the goniometer. (b,  b′) Impact of the filtered beams on the Si(111) crystals with 22 keV X-rays, corresponding to ΘA = 5.1556° and to beam width e = 1.0 mm; paths of these beams filtered by this MAD system have a pitch of 0.1°. (c, c′) Impact of the filtered beams on the Si(111) crystals with 46 keV X-rays, corresponding to ΘA = 2.4632° and to beam width e = 0.55 mm; paths of these beams filtered by this MAD system have a pitch of 0.1°.

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