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Figure 5
Diffraction pattern, and its Rietveld refinement, of an LaB6 reference powder using data filtered by the single-crystal-comb + Soller-collimator + photon-counting detector setup. (a, a′) Intensity of the complete diffractogram using the sum of the beams filtered by the 20 Si(111) single-crystal blades, and magnification of this diagram which underlines the low residual background of this measurement. (b) Visualization of the good agreement between measured and calculated profiles of the (100), (110), (210), (320) and (321) reflections of LaB6; their profiles are well described by a convolution of Gaussian and Lorentzian curves with FWHM = 0.008°.

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