view article
Figure 5
Diffraction pattern, and its Rietveld refinement, of an LaB6 reference powder using data filtered by the single-crystal-comb + Soller-collimator + photon-counting detector setup. (a, a′) Intensity of the complete diffractogram using the sum of the beams filtered by the 20 Si(111) single-crystal blades, and magnification of this diagram which underlines the low residual background of this measurement. (b) Visualization of the good agreement between measured and calculated profiles of the (100), (110), (210), (320) and (321) reflections of LaB6; their profiles are well described by a convolution of Gaussian and Lorentzian curves with FWHM = 0.008°.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 1| January 2023| Pages 126-136
https://doi.org/10.1107/S1600577522011250
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS