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Figure 10
Knife-edge-based stability assessment with the HD-DCM: (a) second crystal pitch step-scan measurement for angle-to-intensity mapping using ionization chamber IC4; (b) intensity measurement at maximum sensitivity point, with reference ionization chamber IC1, transmitted signal IC4 and intensity variation estimate from the HD-DCM internal metrology; (c) power spectrum density (PSD) from the knife-edge measurement, including the HD-DCM estimate and IC noise floors; and (d) PSD from knife-edge measurements with electron beam position monitor (eBPM) data and IC noise floors. For further details see text.

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