Artifact identification in X-ray diffraction data using machine learning methods

Yanxon, H.; Weng, J.; Parraga, H.; Xu, W.; Ruett, U.; Schwarz, N.

doi:10.1107/S1600577522011274

Journal of Synchrotron Radiation Journal of
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Figure 6
Qualitative masking results. (a)–(e) Raw images. (f)–(j) Results of masking using the ASM search. (k)–(o) Results of masking using the gradient boosting method. Each row consists of images that belong to the Nickel, Battery-1, Battery-2, Battery-3 or Battery-4 datasets, respectively, from top to bottom.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 30| Part 1| January 2023| Pages 137-146

https://doi.org/10.1107/S1600577522011274

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